dc.contributor.author | Giri, Chandan | |
dc.date.accessioned | 2024-04-24T11:25:31Z | |
dc.date.available | 2024-04-24T11:25:31Z | |
dc.date.issued | 2008-01 | |
dc.identifier.govdoc | NB13865 | |
dc.identifier.uri | http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/13383 | |
dc.language.iso | en | en_US |
dc.publisher | IIT Kharagpur | en_US |
dc.subject | Test Infrastructure Design | en_US |
dc.subject | System-On-Chip | en_US |
dc.subject | Test Architecture Optimization | en_US |
dc.subject | Electronic Design | en_US |
dc.title | Test Infrastructure Design for Power Aware System-on-Chip Testing | en_US |
dc.type | Thesis | en_US |