IDR - IIT Kharagpur

Design and Development of Jitter Measurement Circuit for High-Speed SerDes System using 65 nm CMOS Process

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dc.contributor.author Sarangi, Santunu
dc.date.accessioned 2023-04-12T06:37:04Z
dc.date.available 2023-04-12T06:37:04Z
dc.date.issued 2022-12
dc.identifier.govdoc NB17661
dc.identifier.uri http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/12746
dc.language.iso en en_US
dc.publisher IIT Kharagpur en_US
dc.subject High-Speed System Design en_US
dc.subject Serdes System en_US
dc.subject 65 nm CMOS Process en_US
dc.subject Jitter Measurement Circuit en_US
dc.subject Phase-Locked Loops en_US
dc.title Design and Development of Jitter Measurement Circuit for High-Speed SerDes System using 65 nm CMOS Process en_US
dc.type Thesis en_US


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