Please use this identifier to cite or link to this item: http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/6182
Title: Thermal-Aware Design and Test Techniques for Two- and Three-Dimensional Networks-on-Chip
Authors: Manna, Kanchan
Keywords: Three Dimensional NoC (3D-NoC)
Network-on-Chip (NoC)
Particle Swarm Optimization (PSO)
Kerninghan-Lin (KL) Partitioning
Thermal-Aware Mapping
Issue Date: Feb-2016
Publisher: IIT, Kharagpur
Gov't Doc #: NB15405
URI: http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/6182
Appears in Collections:Thermal-Aware Design and Test Techniques for Two- and Three-Dimensional Networks-on-Chip

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