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http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/5073| Title: | Improved Test Techniques for Network-on-Chip Based Memory Systems |
| Authors: | Ghoshal, Bibhas |
| Keywords: | FIFO Buffer DRAM Operation SRAM Operation Memory BIST Network-on-Chip |
| Issue Date: | Jul-2014 |
| Publisher: | IIT Kharagpur |
| Gov't Doc #: | NB15125 |
| URI: | http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/5073 |
| Appears in Collections: | Improved Test Techniques for Network-on-Chip Based Memory Systems |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| NB15125_Abstract.pdf | 30.09 kB | Adobe PDF |  View/Open | |
| NB15125_Thesis.pdf Restricted Access | 1.33 MB | Adobe PDF | View/Open Request a copy |
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