Abstract:
In recent times, power consumption has been recognized as an important issue in
implementing battery-operated portable devices. Power consumption of individual
blocks of VLSI circuit is reaching the limits of what can be dealt with by economic
packaging technologies, resulting in the reduction of chip reliability. As a result,
power consumption is being addressed in all levels of VLSI design hierarchy.
Obviously, the saving will be higher if power issues are taken care of early in the
design cycle. This has motivated us to consider power issue at the logic level. Though
dynamic power is still the major source of power consumption, aggressive technology
scaling to get the required performance with reduced production cost has the side
effect of increasing the transistor leakage current. Due to the exponential nature of
leakage current in the subthreshold regime operation of transistors, leakage current
can no longer be ignored. In this thesis we have addressed both the dynamic and
leakage power consumption of the circuit.
