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http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/3853| Title: | Diagnosis Techniques for Identifying Faults in Digital VLSI Circuits |
| Authors: | Kundu, Subhadip |
| Keywords: | VLSI Scan Chain Diagnosis Design for Diagnosis Diagnosability Metric Combinational Logic Diagnosis |
| Issue Date: | 25-Jun-2015 |
| Gov't Doc #: | NB15034 |
| URI: | http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/3853 |
| Appears in Collections: | Diagnosis Techniques for Identifying Faults in Digital VLSI Circuits |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| NB15034_abstract.pdf | 18.29 kB | Adobe PDF |  View/Open | |
| NB15034_thesis.pdf Restricted Access | 875.28 kB | Adobe PDF | View/Open Request a copy |
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