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  4. Diagnosis Techniques for Identifying Faults in Digital VLSI Circuits
Please use this identifier to cite or link to this item: http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/3853
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dc.contributor.authorKundu, Subhadip-
dc.date.accessioned2015-06-25T09:54:25Z-
dc.date.available2015-06-25T09:54:25Z-
dc.date.issued2015-06-25T09:54:25Z-
dc.identifier.govdocNB15034-
dc.identifier.urihttp://www.idr.iitkgp.ac.in/xmlui/handle/123456789/3853-
dc.language.isoen_USen
dc.subjectVLSIen
dc.subjectScan Chain Diagnosisen
dc.subjectDesign for Diagnosisen
dc.subjectDiagnosability Metricen
dc.subjectCombinational Logic Diagnosisen
dc.titleDiagnosis Techniques for Identifying Faults in Digital VLSI Circuitsen
dc.typeThesisen
Appears in Collections:Diagnosis Techniques for Identifying Faults in Digital VLSI Circuits

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