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http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/259| Title: | Failure Diagnosis of Fair Discrete Event System Models and its Application to on-Line Testing of Sequential VLSI Circuits |
| Authors: | Biswas, Santosh |
| Keywords: | Discrete Event Systems Fault Detection Digital Circuit Failure Diagnosis |
| Issue Date: | 2008 |
| Publisher: | IIT Kharagpur |
| Gov't Doc #: | NB13888 |
| URI: | http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/259 |
| Appears in Collections: | Failure Diagnosis of Fair Discrete Event System Models and its Application to on-Line Testing of Sequential VLSI Circuits |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| NB13888_Abstract.pdf Restricted Access | 66.4 kB | Adobe PDF | View/Open Request a copy | |
| NB13888_Thesis.pdf Restricted Access | 2.21 MB | Adobe PDF | View/Open Request a copy |
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