DSpace at My University: Failure Diagnosis of Fair Discrete Event System Models and its Application to on-Line Testing of Sequential VLSI Circuits

Failure Diagnosis of Fair Discrete Event System Models and its Application to on-Line Testing of Sequential VLSI Circuits Collection home page

Author: Santosh Biswas
Guide: Prof. Dipankar Sarkar and Prof. Siddhartha Mukhopadhyay
Department of Computer Science and Engineering
Indian Institute of Technology Kharagpur
November, 2008

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Collection's Items (Sorted by Submit Date in Descending order): 1 to 1 of 1

Issue Date	Title	Author(s)
2008	Failure Diagnosis of Fair Discrete Event System Models and its Application to on-Line Testing of Sequential VLSI Circuits	Biswas, Santosh

Collection's Items (Sorted by Submit Date in Descending order): 1 to 1 of 1

DSpace JSPUI

DSpace preserves and enables easy and open access to all types of digital content including text, images, moving images, mpegs and data sets

Failure Diagnosis of Fair Discrete Event System Models and its Application to on-Line Testing of Sequential VLSI Circuits Collection home page

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