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  4. Failure Diagnosis of Fair Discrete Event System Models and its Application to on-Line Testing of Sequential VLSI Circuits
Please use this identifier to cite or link to this item: http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/259
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dc.contributor.authorBiswas, Santosh
dc.date.accessioned2010-03-09T10:47:24Z
dc.date.available2010-03-09T10:47:24Z
dc.date.issued2008
dc.identifier.govdocNB13888
dc.identifier.urihttp://www.idr.iitkgp.ac.in/xmlui/handle/123456789/259
dc.language.isoenen
dc.publisherIIT Kharagpuren
dc.subjectDiscrete Event Systemsen
dc.subjectFault Detectionen
dc.subjectDigital Circuit
dc.subjectFailure Diagnosis
dc.titleFailure Diagnosis of Fair Discrete Event System Models and its Application to on-Line Testing of Sequential VLSI Circuitsen
dc.typeThesisen
Appears in Collections:Failure Diagnosis of Fair Discrete Event System Models and its Application to on-Line Testing of Sequential VLSI Circuits

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