Please use this identifier to cite or link to this item:
http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/13412
Title: | Customizing Incompletely Specified Test Pattern Set for Power, Thermal and Confidence Aware Testing and Fault Diagnosis |
Authors: | Maiti, Tapas Kumar |
Keywords: | Test Data Compression Test Power Reduction Peak Temperature Thermal Aware Testing Particle Swarm Optimization |
Issue Date: | Jul-2015 |
Publisher: | IIT Kharagpur |
Gov't Doc #: | NB15239 |
URI: | http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/13412 |
Appears in Collections: | Customizing Incompletely Specified Test Pattern Set for Power, Thermal and Confidence Aware Testing and Fault Diagnosis |
Files in This Item:
File | Description | Size | Format | |
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NB15239_Abstract.pdf | 86.66 kB | Adobe PDF | View/Open | |
NB15239_Thesis.pdf Restricted Access | 12.21 MB | Adobe PDF | View/Open Request a copy |
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