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  4. Customizing Incompletely Specified Test Pattern Set for Power, Thermal and Confidence Aware Testing and Fault Diagnosis
Please use this identifier to cite or link to this item: http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/13412
Title: Customizing Incompletely Specified Test Pattern Set for Power, Thermal and Confidence Aware Testing and Fault Diagnosis
Authors: Maiti, Tapas Kumar
Keywords: Test Data Compression
Test Power Reduction
Peak Temperature
Thermal Aware Testing
Particle Swarm Optimization
Issue Date: Jul-2015
Publisher: IIT Kharagpur
Gov't Doc #: NB15239
URI: http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/13412
Appears in Collections:Customizing Incompletely Specified Test Pattern Set for Power, Thermal and Confidence Aware Testing and Fault Diagnosis

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