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  3. Electronics & Electrical Communication Engineering
  4. Customizing Incompletely Specified Test Pattern Set for Power, Thermal and Confidence Aware Testing and Fault Diagnosis
Please use this identifier to cite or link to this item: http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/13412
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dc.contributor.authorMaiti, Tapas Kumar-
dc.date.accessioned2024-04-24T12:08:23Z-
dc.date.available2024-04-24T12:08:23Z-
dc.date.issued2015-07-
dc.identifier.govdocNB15239-
dc.identifier.urihttp://www.idr.iitkgp.ac.in/xmlui/handle/123456789/13412-
dc.language.isoenen_US
dc.publisherIIT Kharagpuren_US
dc.subjectTest Data Compressionen_US
dc.subjectTest Power Reductionen_US
dc.subjectPeak Temperatureen_US
dc.subjectThermal Aware Testingen_US
dc.subjectParticle Swarm Optimizationen_US
dc.titleCustomizing Incompletely Specified Test Pattern Set for Power, Thermal and Confidence Aware Testing and Fault Diagnosisen_US
dc.typeThesisen_US
Appears in Collections:Customizing Incompletely Specified Test Pattern Set for Power, Thermal and Confidence Aware Testing and Fault Diagnosis

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