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http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/2511
Title: | Detection and Characterization of Defects by Eddy Current Testing Using Pattern Recognition Approaches |
Authors: | SHYAMSUNDER, M.T. |
Keywords: | Thickness Software K-nearest Fatigue cracks Stress corrosion Multi-layered Kohonen’s Neighbour Statistical classifiers Current signals Eddy |
Issue Date: | 1998 |
Publisher: | IIT Kharagpur |
Gov't Doc #: | NB12294 |
URI: | http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/2511 |
Appears in Collections: | Detection and Characterization of Defects by Eddy Current Testing Using Pattern Recognition Approaches |
Files in This Item:
File | Description | Size | Format | |
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NB12294_Abstract.pdf | 509.7 kB | Adobe PDF | ![]() View/Open | |
NB12294_Thesis.pdf Restricted Access | 16.18 MB | Adobe PDF | View/Open Request a copy |
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