Please use this identifier to cite or link to this item: http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/2511
Title: Detection and Characterization of Defects by Eddy Current Testing Using Pattern Recognition Approaches
Authors: SHYAMSUNDER, M.T.
Keywords: Thickness
Software
K-nearest
Fatigue cracks
Stress corrosion
Multi-layered
Kohonen’s
Neighbour
Statistical classifiers
Current signals
Eddy
Issue Date: 1998
Publisher: IIT Kharagpur
Gov't Doc #: NB12294
URI: http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/2511
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