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http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/1520Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kumar S., Krishna | |
| dc.date.accessioned | 2012-06-26T04:55:23Z | |
| dc.date.available | 2012-06-26T04:55:23Z | |
| dc.date.issued | 2012-03 | |
| dc.identifier.govdoc | NB14575 | |
| dc.identifier.uri | http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/1520 | |
| dc.language.iso | en | en |
| dc.publisher | IIT Kharagpur | en |
| dc.subject | Testing Techniques | en |
| dc.title | Power- and Thermal-Aware Digital Testing Techniques | en |
| dc.type | Thesis | en |
| Appears in Collections: | Power- and Thermal-Aware Digital Testing Techniques | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| NB14575.pdf Restricted Access | 3.66 MB | Adobe PDF | View/Open Request a copy | |
| NB14575_Abstract.pdf | 224.56 kB | Adobe PDF |  View/Open | |
| NB14575_CV.pdf | 285.62 kB | Adobe PDF |  View/Open |
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