Please use this identifier to cite or link to this item:
http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/11649
Title: | Molecular Characterization of Fungal Pathogens in Stored Wheat Grains and Development of Sensitive Immunological Method for Their Detection |
Authors: | Kumari, Ranjana |
Keywords: | Stored wheat grain Fungal prevalence Aflatoxin Cytotoxicity Apoptosis |
Issue Date: | Jul-2021 |
Publisher: | IIT Kharagpur |
Gov't Doc #: | NB17112 |
URI: | http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/11649 |
Appears in Collections: | Molecular Characterization of Fungal Pathogens in Stored Wheat Grains and Development of Sensitive Immunological Method for Their Detection |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
NB17112_Abstract.pdf | 50.28 kB | Adobe PDF | View/Open | |
NB17112_Thesis.pdf Restricted Access | 8.16 MB | Adobe PDF | View/Open Request a copy |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.