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  4. Molecular Characterization of Fungal Pathogens in Stored Wheat Grains and Development of Sensitive Immunological Method for Their Detection
Please use this identifier to cite or link to this item: http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/11649
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dc.contributor.authorKumari, Ranjana-
dc.date.accessioned2022-08-18T04:17:40Z-
dc.date.available2022-08-18T04:17:40Z-
dc.date.issued2021-07-
dc.identifier.govdocNB17112-
dc.identifier.urihttp://www.idr.iitkgp.ac.in/xmlui/handle/123456789/11649-
dc.language.isoenen_US
dc.publisherIIT Kharagpuren_US
dc.subjectStored wheat grainen_US
dc.subjectFungal prevalenceen_US
dc.subjectAflatoxinen_US
dc.subjectCytotoxicityen_US
dc.subjectApoptosisen_US
dc.titleMolecular Characterization of Fungal Pathogens in Stored Wheat Grains and Development of Sensitive Immunological Method for Their Detectionen_US
dc.typeThesisen_US
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