Failure Diagnosis of Fair Discrete Event System Models and its Application to on-Line Testing of Sequential VLSI Circuits

dc.contributor.author	Biswas, Santosh
dc.date.accessioned	2010-03-09T10:47:24Z
dc.date.available	2010-03-09T10:47:24Z
dc.date.issued	2008
dc.identifier.govdoc	NB13888
dc.identifier.uri	http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/259
dc.language.iso	en	en
dc.publisher	IIT Kharagpur	en
dc.subject	Discrete Event Systems	en
dc.subject	Fault Detection	en
dc.subject	Digital Circuit
dc.subject	Failure Diagnosis
dc.title	Failure Diagnosis of Fair Discrete Event System Models and its Application to on-Line Testing of Sequential VLSI Circuits	en
dc.type	Thesis	en