IDR - IIT Kharagpur

Failure Diagnosis of Fair Discrete Event System Models and its Application to on-Line Testing of Sequential VLSI Circuits

Failure Diagnosis of Fair Discrete Event System Models and its Application to on-Line Testing of Sequential VLSI Circuits

 

Author: Santosh Biswas
Guide: Prof. Dipankar Sarkar and Prof. Siddhartha Mukhopadhyay
Department of Computer Science and Engineering
Indian Institute of Technology Kharagpur
November, 2008

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