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  4. Processing and Characterization of Perovskite Oxide Thin Films for High-K Dielectric Applications
Please use this identifier to cite or link to this item: http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/9260
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dc.contributor.authorSamantaray, Chandan Bhusan-
dc.date.accessioned2018-07-16T11:04:29Z-
dc.date.available2018-07-16T11:04:29Z-
dc.date.issued2002-06-01-
dc.identifier.govdocNB12745-
dc.identifier.urihttp://www.idr.iitkgp.ac.in/xmlui/handle/123456789/9260-
dc.language.isoenen
dc.publisherIIT, Kharagpuren
dc.subjectPerovskite Oxideen
dc.subjectElectrical Propertiesen
dc.subjectLeakage Currenten
dc.subjectOptical Propertiesen
dc.subjectBulk Ceramicsen
dc.titleProcessing and Characterization of Perovskite Oxide Thin Films for High-K Dielectric Applicationsen
dc.typeThesisen
Appears in Collections:Processing and Characterization of Perovskite Oxide Thin Films for High-K Dielectric Applications

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