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  4. Design-for-Test Techniques for SOC Designs
Please use this identifier to cite or link to this item: http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/8136
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dc.contributor.authorRao, C. V. Guru
dc.date.accessioned2017-08-21T09:15:22Z
dc.date.available2017-08-21T09:15:22Z
dc.date.issued2003-10-01
dc.identifier.govdocNB13122
dc.identifier.urihttp://www.idr.iitkgp.ac.in/xmlui/handle/123456789/8136
dc.language.isoenen
dc.publisherIIT, Kharagpuren
dc.subjectDesign-For-Testen
dc.subjectSystematic Methodologyen
dc.subjectHigh Fault Coverageen
dc.subjectSoc Designsen
dc.subjectSystem-Levelen
dc.titleDesign-for-Test Techniques for SOC Designsen
dc.typeThesisen
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