Please use this identifier to cite or link to this item: http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/3642
Title: Design of Easily Testable PLAs & their Testing Algorithms
Authors: Mottalib, Md. Abdul
Keywords: Testing Algorithms
Fault Model
BIST
Easily Testable Design
Design-for-Testability
Structural testing
Test Vectors
Parallel Testing Technique
PLAs
Issue Date: 1992
Publisher: IIT, Kharagpur
Gov't Doc #: NB11630
URI: http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/3642
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