Please use this identifier to cite or link to this item:
http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/1820
Title: | Effect of interface passivation on the electrical characteristics of GaAs based metal-oxide-semiconductor capacitors |
Authors: | Kundu, Souvik |
Keywords: | Semiconductor Capacitors Metal Oxide |
Issue Date: | Jan-2013 |
Publisher: | IIT Kharagpur |
Gov't Doc #: | NB14722 |
URI: | http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/1820 |
Appears in Collections: | Effect of interface passivation on the electrical characteristics of GaAs based metal-oxide-semiconductor capacitors |
Files in This Item:
File | Description | Size | Format | |
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NB14722_Abstract.pdf | 398.24 kB | Adobe PDF | ![]() View/Open | |
NB14722_Thesis.pdf Restricted Access | 8.5 MB | Adobe PDF | View/Open Request a copy |
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