Please use this identifier to cite or link to this item: http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/1820
Title: Effect of interface passivation on the electrical characteristics of GaAs based metal-oxide-semiconductor capacitors
Authors: Kundu, Souvik
Keywords: Semiconductor
Capacitors
Metal Oxide
Issue Date: Jan-2013
Publisher: IIT Kharagpur
Gov't Doc #: NB14722
URI: http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/1820
Appears in Collections:Effect of interface passivation on the electrical characteristics of GaAs based metal-oxide-semiconductor capacitors

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