On Some Problems Related to Near Surface Quantitative Composition Analysis by X-Ray Photoelectron Spectroscopy

dc.contributor.author	Sreemany, Monjoy
dc.date.accessioned	2018-07-17T10:37:00Z
dc.date.available	2018-07-17T10:37:00Z
dc.date.issued	1995-01-01
dc.identifier.govdoc	NB11879
dc.identifier.uri	http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/9286
dc.language.iso	en	en
dc.publisher	IIT, Kharagpur	en
dc.subject	X-Ray Photoelectron Spectrum	en
dc.subject	Inelastic-Electron-Scattering	en
dc.subject	Xps System	en
dc.subject	Alloys	en
dc.subject	Spectrometer Response	en
dc.subject	Spectrometer Calibration	en
dc.title	On Some Problems Related to Near Surface Quantitative Composition Analysis by X-Ray Photoelectron Spectroscopy	en
dc.type	Thesis	en