A New Test Techniques for Heterogeneous Embedded Cores in SOC

dc.contributor.author	Banerjee, Shibaji
dc.date.accessioned	2015-10-09T05:10:59Z
dc.date.available	2015-10-09T05:10:59Z
dc.date.issued	2006-08
dc.identifier.govdoc	NB13360 ; NB13642
dc.identifier.uri	http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/5179
dc.language.iso	en	en
dc.publisher	IIT Kharagpur	en
dc.subject	Fault Modeling	en
dc.subject	Built-In Self -Test	en
dc.subject	Test Access Mechanism	en
dc.subject	SOC Test	en
dc.subject	System-On-Chip	en
dc.title	A New Test Techniques for Heterogeneous Embedded Cores in SOC	en
dc.type	Thesis	en