Diagnosis Techniques for Identifying Faults in Digital VLSI Circuits

dc.contributor.author	Kundu, Subhadip
dc.date.accessioned	2015-06-25T09:54:25Z
dc.date.available	2015-06-25T09:54:25Z
dc.date.issued	2015-06-25T09:54:25Z
dc.identifier.govdoc	NB15034
dc.identifier.uri	http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/3853
dc.language.iso	en_US	en
dc.subject	VLSI	en
dc.subject	Scan Chain Diagnosis	en
dc.subject	Design for Diagnosis	en
dc.subject	Diagnosability Metric	en
dc.subject	Combinational Logic Diagnosis	en
dc.title	Diagnosis Techniques for Identifying Faults in Digital VLSI Circuits	en
dc.type	Thesis	en