dc.contributor.author | Mottalib, Md. Abdul | |
dc.date.accessioned | 2015-04-06T11:02:05Z | |
dc.date.available | 2015-04-06T11:02:05Z | |
dc.date.issued | 1992 | |
dc.identifier.govdoc | NB11630 | |
dc.identifier.uri | http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/3642 | |
dc.language.iso | en | en |
dc.publisher | IIT, Kharagpur | en |
dc.subject | Testing Algorithms | |
dc.subject | Fault Model | |
dc.subject | BIST | |
dc.subject | Easily Testable Design | |
dc.subject | Design-for-Testability | |
dc.subject | Structural testing | en |
dc.subject | Test Vectors | en |
dc.subject | Parallel Testing Technique | |
dc.subject | PLAs | en |
dc.title | Design of Easily Testable PLAs & their Testing Algorithms | en |
dc.type | Thesis | en |