Effect of interface passivation on the electrical characteristics of GaAs based metal-oxide-semiconductor capacitors

dc.contributor.author	Kundu, Souvik
dc.date.accessioned	2013-09-19T10:11:06Z
dc.date.available	2013-09-19T10:11:06Z
dc.date.issued	2013-01
dc.identifier.govdoc	NB14722
dc.identifier.uri	http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/1820
dc.language.iso	en_US	en
dc.publisher	IIT Kharagpur	en
dc.subject	Semiconductor	en
dc.subject	Capacitors	en
dc.subject	Metal Oxide	en
dc.title	Effect of interface passivation on the electrical characteristics of GaAs based metal-oxide-semiconductor capacitors	en
dc.type	Thesis	en