dc.contributor.author | Sanyal, Sayandeep | |
dc.date.accessioned | 2024-07-15T06:48:42Z | |
dc.date.available | 2024-07-15T06:48:42Z | |
dc.date.issued | 2023-11 | |
dc.identifier.govdoc | NB18097 | |
dc.identifier.uri | http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/14859 | |
dc.language.iso | en | en_US |
dc.publisher | IIT Kharagpur | en_US |
dc.subject | Analog Coverage Management | en_US |
dc.subject | Analog Defect Coverage | en_US |
dc.subject | AMS Assertions | en_US |
dc.subject | Recurrence | en_US |
dc.subject | Circuit Ageing | en_US |
dc.title | Design Automation for Functional and Defect Coverage in Mixed-Signal Integrated Circuits | en_US |
dc.type | Thesis | en_US |