dc.contributor.author | Maiti, Tapas Kumar | |
dc.date.accessioned | 2024-04-24T12:08:23Z | |
dc.date.available | 2024-04-24T12:08:23Z | |
dc.date.issued | 2015-07 | |
dc.identifier.govdoc | NB15239 | |
dc.identifier.uri | http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/13412 | |
dc.language.iso | en | en_US |
dc.publisher | IIT Kharagpur | en_US |
dc.subject | Test Data Compression | en_US |
dc.subject | Test Power Reduction | en_US |
dc.subject | Peak Temperature | en_US |
dc.subject | Thermal Aware Testing | en_US |
dc.subject | Particle Swarm Optimization | en_US |
dc.title | Customizing Incompletely Specified Test Pattern Set for Power, Thermal and Confidence Aware Testing and Fault Diagnosis | en_US |
dc.type | Thesis | en_US |