Design of Radiation Tolerant Reliable CMOS Circuits

dc.contributor.author	Zille Ilahi, Sajjade Faisal Mustafa
dc.date.accessioned	2022-09-12T10:53:33Z
dc.date.available	2022-09-12T10:53:33Z
dc.date.issued	2021-09
dc.identifier.govdoc	NB17180
dc.identifier.uri	http://www.idr.iitkgp.ac.in/xmlui/handle/123456789/11778
dc.language.iso	en	en_US
dc.publisher	IIT Kharagpur	en_US
dc.subject	Reliability issues	en_US
dc.subject	Reliability improvement	en_US
dc.subject	Critical charge	en_US
dc.subject	Reliable CMOS circuits	en_US
dc.subject	RHBD latch	en_US
dc.title	Design of Radiation Tolerant Reliable CMOS Circuits	en_US
dc.type	Thesis	en_US