<?xml version="1.0" encoding="UTF-8"?><rss xmlns:dc="http://purl.org/dc/elements/1.1/" version="2.0">
<channel>
<title>New Techniques in Testing and Timing Verification of System-on-Chips</title>
<link>http://127.0.0.1/xmlui/handle/123456789/632</link>
<description/>
<pubDate>Thu, 16 Apr 2026 21:41:44 GMT</pubDate>
<dc:date>2026-04-16T21:41:44Z</dc:date>
<item>
<title>New Techniques in Testing and Timing Verification of System-on-Chips</title>
<link>http://127.0.0.1/xmlui/handle/123456789/633</link>
<description>New Techniques in Testing and Timing Verification of System-on-Chips
Chakraborty, Rupsa
THE PRIMARY CHALLENGE during the modern integrated circuit development process&#13;
lies in coping with the progressively shorter time-to-market of the chips. Modular&#13;
design through design re-use in the System-on-Chip (SoC) technology though aids in&#13;
reducing the design time, the process of testing and verification of such highly complex&#13;
circuits turns out to be more challenging.
</description>
<pubDate>Fri, 01 Jan 2010 00:00:00 GMT</pubDate>
<guid isPermaLink="false">http://127.0.0.1/xmlui/handle/123456789/633</guid>
<dc:date>2010-01-01T00:00:00Z</dc:date>
</item>
</channel>
</rss>
