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<title>New Techniques in Testing and Timing Verification of System-on-Chips</title>
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<description>New Techniques in Testing and Timing Verification of System-on-Chips
Chakraborty, Rupsa
THE PRIMARY CHALLENGE during the modern integrated circuit development process&#13;
lies in coping with the progressively shorter time-to-market of the chips. Modular&#13;
design through design re-use in the System-on-Chip (SoC) technology though aids in&#13;
reducing the design time, the process of testing and verification of such highly complex&#13;
circuits turns out to be more challenging.
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<dc:date>2010-01-01T00:00:00Z</dc:date>
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