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<title>New Techniques in Testing and Timing Verification of System-on-Chips</title>
<link href="http://127.0.0.1/xmlui/handle/123456789/632" rel="alternate"/>
<subtitle/>
<id>http://127.0.0.1/xmlui/handle/123456789/632</id>
<updated>2026-04-17T13:35:20Z</updated>
<dc:date>2026-04-17T13:35:20Z</dc:date>
<entry>
<title>New Techniques in Testing and Timing Verification of System-on-Chips</title>
<link href="http://127.0.0.1/xmlui/handle/123456789/633" rel="alternate"/>
<author>
<name>Chakraborty, Rupsa</name>
</author>
<id>http://127.0.0.1/xmlui/handle/123456789/633</id>
<updated>2015-06-01T11:09:08Z</updated>
<published>2010-01-01T00:00:00Z</published>
<summary type="text">New Techniques in Testing and Timing Verification of System-on-Chips
Chakraborty, Rupsa
THE PRIMARY CHALLENGE during the modern integrated circuit development process&#13;
lies in coping with the progressively shorter time-to-market of the chips. Modular&#13;
design through design re-use in the System-on-Chip (SoC) technology though aids in&#13;
reducing the design time, the process of testing and verification of such highly complex&#13;
circuits turns out to be more challenging.
</summary>
<dc:date>2010-01-01T00:00:00Z</dc:date>
</entry>
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